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1 article(s) from Fuhrmann, Marc

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

Alexander Krivcov,
Jasmin Ehrler,
Marc Fuhrmann,
Tanja Junkers and
Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

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Figure 1: Phase shift as a function of the tip–substrate distance z; calculated for a silicon substrate with V...

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Figure 2: Substrate without dielectric layer and with dielectric layer. The dielectric layer allows the tip t...

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Figure 3: Phase shift due to capacitive coupling as a function of the lift height for nanoparticles with 10 n...

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Figure 4: a) Sketch of a MFM measurement of a dielectric layer with defined roughness (R_max); b) Simulation f...

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Figure 5: Schematic representation of the distance between tip and nanoparticle dipole during the interleave ...

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Figure 6: Simulation of the MFM phase for a single SPION using a Gaussian topographic profile corresponding t...

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Figure 7: Phase shift above nanoparticles (10 ± 2 nm) on dielectric layers of various thicknesses as a functi...

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Figure 8: Calculated ( [Graphic 2] ; black line) and measured phase shift for single nanoparticles with 10 ± 2 nm diameter...

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Figure 9: Measurement of a single SPION with 10 ± 2 nm diameter on a silicon substrate with a dielectric laye...

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Figure 10: Measurement of a single SPION with 12 ± 1 nm diameter on a silicon substrate recorded with an ASYMF...

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Published 17 May 2019

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